Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory
Nikolaos Papandreou, Haralampos Pozidis, Thomas Parnell, Nikolas Ioannou, Roman Pletka, Sasa Tomic, Patrick Breen, Garry Tressler, Aaron Fry, Timothy Fisher
International Reliability Physics Symposium
April 2019