category: Symposium

2019

• Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory
  Nikolaos Papandreou, Haralampos Pozidis, Thomas Parnell, Nikolas Ioannou, Roman Pletka, Sasa Tomic, Patrick Breen, Gary Tressler, Aaron Fry, Timothy Fisher
  Proceedings of the IEEE International Reliability Physics Symposium (IRPS)
  April 2019
  (abstract | pdf | bibtex)
  
  

2011

• Subsystem and System-level Implications of PCM
  Robert Haas, Xiao-Yu Hu, Ioannis Koltsidas, Roman Pletka
  European\Phase Change and Ovonics Symposium (E\PCOS), Zurich
  November 2011
  (abstract | pdf | bibtex)