tag: IRPS

2020

• Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash
  Nikolaos Papandreou, Haralampos Pozidis, Nikolas Ioannou, Thomas Parnell, Roman Pletka, Milos Stanisavljevic, Radu Stoica, Sasa Tomic, Patrick Breen, Gary Tressler, Aaron Fry, Tim Fisher, Andrew Walls
  Proceedings of the 2020 IEEE International Reliability Physics Symposium (IRPS)
  April 2020
  (abstract | pdf | bibtex)
  
  

2019

• Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory
  Nikolaos Papandreou, Haralampos Pozidis, Thomas Parnell, Nikolas Ioannou, Roman Pletka, Sasa Tomic, Patrick Breen, Gary Tressler, Aaron Fry, Timothy Fisher
  Proceedings of the IEEE International Reliability Physics Symposium (IRPS)
  April 2019
  (abstract | pdf | bibtex)