Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash
Nikolaos Papandreou, Haralampos Pozidis, Nikolas Ioannou, Thomas Parnell, Roman Pletka, Milos Stanisavljevic, Radu Stoica, Sasa Tomic, Patrick Breen, Gary Tressler, Aaron Fry, Tim Fisher, Andrew Walls
Proceedings of the 2020 IEEE International Reliability Physics Symposium (IRPS)
April 2020